Scanning Electron Microscopy and X-Ray Microanalysis
| Author | : | |
| Rating | : | 4.88 (515 Votes) |
| Asin | : | 149396674X |
| Format Type | : | paperback |
| Number of Pages | : | 658 Pages |
| Publish Date | : | 2015-07-21 |
| Language | : | English |
DESCRIPTION:
A lot of very distinct images and schematic drawings make for a very interesting book and help readers who study scanning electron microscopy and X-ray microanalysis. Form the reviews of the third edition:“There is no other single volume that covers as much theory and practice of SEM or X-ray microanalysis as Scanning Electron Microscopy and X-ray Microanalysis, 3rd Edition does. It is clearly written well organized. Wilson, Scanning, Vol. 27 (4), July/August, 2005)“As the authors pointed out, the number of equations in the book is kept to a minimum, and important conceptions are also explained in a qualitative manner. It is an excellent textbook for graduate students, and an outstanding reference for engineers, physical, and biological scientists.” (Microscopy and Microanalysis, Vol. This is a reference text that no SEM or EPMA laboratory should be with
The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a "dual beam" platform incorporating both electron and ion columns allows precision modification of the specimen by focused ion beam milling. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc. Students and academic researchers will find the text to be an authoritative and scholarly resource,